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Volumn 17, Issue 4, 2009, Pages 246-248
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Investigation of bulk metallic glass structure by means of electron irradiation
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Author keywords
B. Electrical resistance and other electrical properties; B. Glasses, metallic; B. Irradiation effects; D. Defects: point defects
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Indexed keywords
DEFECT STRUCTURES;
ELECTRIC PROPERTIES;
ELECTRIC RESISTANCE;
ELECTRON IRRADIATION;
GLASS;
LIQUID METALS;
MODEL STRUCTURES;
POINT DEFECTS;
RADIATION;
RADIATION DAMAGE;
RELAXATION PROCESSES;
B. ELECTRICAL RESISTANCE AND OTHER ELECTRICAL PROPERTIES;
B. GLASSES, METALLIC;
B. IRRADIATION EFFECTS;
BULK METALLIC GLASS;
D. DEFECTS: POINT DEFECTS;
DEFECT MOBILITIES;
DOSE DEPENDENCES;
ELECTRICAL RESISTANCE MEASUREMENTS;
ELECTRICAL RESISTANCES;
IRRADIATED SAMPLES;
MEV-ELECTRONS;
POLYCLUSTER;
PRIMARY RADIATIONS;
RADIATION DEFECTS;
RELAXATION KINETICS;
SHORT-RANGE ORDERS;
STRUCTURAL DEFECTS;
STRUCTURAL FEATURES;
STRUCTURAL MODELS;
TEMPERATURE RANGES;
THERMALLY ACTIVATED PROCESS;
METALLIC GLASS;
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EID: 60849126668
PISSN: 09669795
EISSN: None
Source Type: Journal
DOI: 10.1016/j.intermet.2008.09.015 Document Type: Article |
Times cited : (16)
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References (20)
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