Seebeck coefficient of nanostructured phosphorus-alloyed bismuth telluride thick films

Journal of Alloys and Compounds

Volumn 471, Issue 1-2, 2009, Pages 278-281

  Zhou, J ^a,b   Li, S ^b   Soliman, H M A ^b   Toprak, M S ^b   Muhammed, M ^b   Platzek, D ^c   Muller E ^c  

^a XIAMEN UNIVERSITY   (China)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^c GERMAN AEROSPACE CENTER DLR   (Germany)

Author keywords

Microstructure; Seebeck microprobe; Thermoelectric materials

Indexed keywords

BISMUTH; MICROSTRUCTURE; PHOSPHORUS; REDUCTION; TELLURIUM COMPOUNDS; THERMOELECTRIC EQUIPMENT; THICK FILMS;

AVERAGE GRAIN SIZES; BISMUTH TELLURIDES; ELECTRO-CHEMICAL DEPOSITIONS; N-TYPE CONDUCTIVITIES; NANO-STRUCTURED; SCHERRER'S EQUATIONS; SEEBECK MICROPROBE; SITE OCCUPANCIES; THERMOELECTRIC MATERIALS;

SEEBECK COEFFICIENT;

EID: 60849119581     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.03.088     Document Type: Article

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