Rapid thermal annealing of chemical bath-deposited CuxS films and their characterization

Journal of Alloys and Compounds

Volumn 471, Issue 1-2, 2009, Pages 553-556

  Nien, Yung Tang ^a   Chen, In Gann ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Chemical synthesis; Light absorption and reflection; Phase transitions; Photoelectron spectroscopies; Semiconductors

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; AMORPHOUS FILMS; COPPER COMPOUNDS; CRYSTALS; ELECTRIC CONDUCTIVITY; ELECTRODEPOSITION; ELECTRONS; LIGHT ABSORPTION; LIGHT REFLECTION; PHASE TRANSITIONS; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; RAPID THERMAL ANNEALING; RAPID THERMAL PROCESSING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR MATERIALS; SPECTRUM ANALYSIS; SULFUR; SYNTHESIS (CHEMICAL); THIOUREAS; UREA; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL BATHS; CHEMICAL SYNTHESIS; COPPER COMPLEXES; COPPER SULFIDES; ELEMENTAL MAPPINGS; HOMOGENEOUS DISTRIBUTIONS; LIGHT ABSORPTION AND REFLECTION; OPTICAL TRANSMISSION SPECTRUM; PHASE TRANSFORMATIONS; ROOM TEMPERATURES; SCANNING ELECTRON MICROGRAPHS; SEMICONDUCTORS; SILICON SUBSTRATES; X-RAY PHOTOELECTRON SPECTRUM;

COPPER;

EID: 60849115285     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.04.012     Document Type: Article

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