Depth discrimination enhanced computational integral imaging using random pattern illumination

Japanese Journal of Applied Physics

Volumn 48, Issue 2, 2009, Pages

  Baasantseren, Ganbat ^a   Park, Jae Hyeung ^a   Kim, Nam ^a  

^a Chungbuk National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; LAW ENFORCEMENT;

BLURRED IMAGES; DEPTH DISCRIMINATIONS; ELEMENTAL IMAGES; INTEGRAL IMAGING; RANDOM PATTERNS; SECTION IMAGES; SIMULATION RESULTS; UNIFORM ILLUMINATIONS;

COMPUTATIONAL METHODS;

EID: 60849110576     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.48.020216     Document Type: Article

References (8)

1. D. H. Shin, E. S. Kim, and B. Lee: Jpn. J. Appl. Phys. 44 (2005) 8016.
2. S. H. Hong, J. S. Jang, and B. Javidi: Opt. Express 12 (2004) 483.
3. S. H. Hong and B. Javidi: Opt. Express 12 (2004) 4579.
4. B. Lee, J.-H. Park, and S.-W. Min: in Digital Holography and Three-Dimensional Display, ed. T.-C. Poon (Springer, New York, 2006) p. 333.
5. G. Lippmann: C. R. Acad. Sci. 146 (1908) 446 [in French].
6. F. Okano, H. Hoshino, J. Arai, and J. Yuyama: Appl. Opt. 36 (1997) 1598.
7. A. Stern and B. Javidi: Proc. IEEE 94 (2006) 591.
8. J. Garcia, Z. Zalevsky, P. Garcia-Martinez, C. Ferriera, M. Teicher, and Y. Beiderman: Appl. Opt. 47 (2008) 3032.