Synthesis, rietveld analysis, and solid state nuclear magnetic resonance of X2-Sc2SiO5

Journal of the American Ceramic Society

Volumn 92, Issue 2, 2009, Pages 487-490

  Alba, María D ^a   Chain, Pablo ^a   González Carrascosa, Triana ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

GELATION; MECHANISMS; NUCLEAR MAGNETIC RESONANCE; OPTICAL PROPERTIES; POLYMORPHISM; RARE EARTH ELEMENTS; RARE EARTHS; RIETVELD ANALYSIS; RIETVELD METHOD; SCANDIUM; SCINTILLATION COUNTERS; SILICON; SILICON COMPOUNDS; SINGLE CRYSTALS; SOL-GEL PROCESS; SYNTHESIS (CHEMICAL);

CRYSTALLOGRAPHIC SITES; MAS-NMR; MONOCLINIC UNITS; NMR CHEMICAL SHIFTS; OXYORTHOSILICATES; POWDER X-RAY DIFFRACTIONS; SHIFT PARAMETERS; SOL-GEL METHODS; SOLID-STATE NUCLEAR MAGNETIC RESONANCES; SPACE GROUPS; STRUCTURAL ASPECTS; STRUCTURE PARAMETERS; UNIT CELL PARAMETERS; UNIT CELLS; X-RAY SPECTROSCOPIES; XRD; XRD PATTERNS;

NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY;

EID: 60849085980     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2008.02877.x     Document Type: Article

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