Why do antiferroelectrics show higher fatigue resistance than ferroelectrics under bipolar electrical cycling?

Applied Physics Letters

Volumn 94, Issue 7, 2009, Pages

  Lou, X J ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

FATIGUE OF MATERIALS;

ANTIFERROELECTRICS; DEPOLARIZATION FIELDS; ELECTRICAL CYCLING; FATIGUE ENDURANCES; FATIGUE MODELS; FATIGUE RESISTANCES; INJECTED POWER; LOCAL PHASE; PHASE NUCLEATIONS; UNIPOLAR PULSE;

FERROELECTRIC MATERIALS;

EID: 60749123969     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3082375     Document Type: Article

References (22)

1. W. Y. Pan, C. Q. Dam, Q. M. Zhang, and L. E. Cross, J. Appl. Phys. 0021-8979 10.1063/1.343578 66, 6014 (1989).
2. D. Berlincourt, H. H. A. Krueger, and B. Jaffe, J. Phys. Chem. Solids 0022-3697 10.1016/0022-3697(64)90175-1 25, 659 (1964).
3. Z. Xu, D. Viehland, P. Yang, and D. A. Payne, J. Appl. Phys. 0021-8979 10.1063/1.354568 74, 3406 (1993).
4. J. F. Scott, Ferroelectric Memories (Springer, New York, 2000).
5. L. J. Zhou, A. Zimmermann, Y. P. Zeng, and F. Aldinger, J. Mater. Sci. 0022-2461 10.1023/B:JMSC.0000021441.92377.e4 39, 2675 (2004).
6. Y. Y. Hu, Y. J. Feng, S. Xia, Z. Xu, and X. Yao, Ferroelectrics 0015-0193 10.1080/00150190701517416 355, 125 (2007).
7. L. J. Zhou, R. Z. Zuo, G. Rixecker, A. Zimmermann, T. Utschig, and F. Aldinger, J. Appl. Phys. 0021-8979 10.1063/1.2172725 99, 044102 (2006).
8. L. J. Zhou, A. Zimmermann, Y. P. Zeng, and F. Aldinger, J. Am. Ceram. Soc. 87, 1591 (2004). 0002-7820
9. J. H. Jang, K. H. Yoon, and K. Y. Oh, Mater. Res. Bull. 0025-5408 10.1016/S0025-5408(00)00225-7 35, 393 (2000).
10. J. H. Jang, K. H. Yoon, and H. J. Shin, Appl. Phys. Lett. 0003-6951 10.1063/1.122294 73, 1823 (1998).
11. Q. Y. Jiang, E. C. Subbarao, and L. E. Cross, J. Appl. Phys. 0021-8979 10.1063/1.356637 75, 7433 (1994).
12. I. Kim, S. Bae, K. Kim, H. Kim, J. S. Lee, J. Jeong, and K. Yamakawa, J. Korean Phys. Soc. 33, 180 (1998).
13. X. J. Lou, M. Zhang, S. A. T. Redfern, and J. F. Scott, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.97.177601 97, 177601 (2006).
14. X. J. Lou, M. Zhang, S. A. T. Redfern, and J. F. Scott, Phys. Rev. B 0163-1829 10.1103/PhysRevB.75.224104 75, 224104 (2007).
15. Q. Li, W. Y. Pan, and L. E. Cross, Mater. Lett. 0167-577X 10.1016/0167-577X(86)90090-X 5, 51 (1986).
16. L. J. Zhou, G. Rixecker, A. Zimmermann, and F. Aldinger, J. Eur. Ceram. Soc. 0955-2219 10.1016/j.jeurceramsoc.2004.12.024 26, 883 (2006).
17. J. W. Zhai and H. D. Chen, Appl. Phys. Lett. 0003-6951 10.1063/1.1594843 83, 978 (2003).
18. J. Nuffer, D. C. Lupascu, A. Glazounov, H. J. Kleebe, and J. Rodel, J. Eur. Ceram. Soc. 0955-2219 10.1016/S0955-2219(02)00017-1 22, 2133 (2002).
19. V. Chikarmane, C. Sudhama, J. Kim, J. Lee, A. Tasch, and S. Novak, J. Vac. Sci. Technol. A 0734-2101 10.1116/1.578045 10, 1562 (1992).
20. C. Verdier, D. C. Lupascu, and J. Rodel, J. Eur. Ceram. Soc. 0955-2219 10.1016/S0955-2219(02)00351-5 23, 1409 (2003).
21. D. J. Kim, J. Y. Jo, T. H. Kim, S. M. Yang, B. Chen, Y. S. Kim, and T. W. Noh, Appl. Phys. Lett. 0003-6951 10.1063/1.2790485 91, 132903 (2007).
22. X. J. Lou, J. Appl. Phys. 105, 024101 (2009).