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Volumn , Issue , 2008, Pages 413-416

The more plot: Displaying measures of risk and error from simulation output

Author keywords

[No Author keywords available]

Indexed keywords

CONFIDENCE INTERVALS; EXPERIMENT DESIGNS; PRIMARY OUTPUTS; SIMULATION EXPERIMENTS;

EID: 60749098031     PISSN: 08917736     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WSC.2008.4736095     Document Type: Conference Paper
Times cited : (25)

References (2)
  • 2
    • 0029538757 scopus 로고    scopus 로고
    • Wood, D. C. and B. W. Schmeiser. 1995. Overlapping batch quantiles. Proceedings of the 1995 Winter Simulation Conference, ed. C. Alexopoulos, K, Kang, W. R. Lilegdon and D. Goldsman, 303-308. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.
    • Wood, D. C. and B. W. Schmeiser. 1995. Overlapping batch quantiles. Proceedings of the 1995 Winter Simulation Conference, ed. C. Alexopoulos, K, Kang, W. R. Lilegdon and D. Goldsman, 303-308. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.