Development of a switched integrator amplifier for high-accuracy optical measurements

Applied Optics

Volumn 47, Issue 31, 2008, Pages 5821-5828

  Mountford, John ^a   Porrovecchio, Geiland ^b   Smid, Marek ^b   Smid, Radislav ^c  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b CZECH METROLOGY INSTITUTE   (Czech Republic)

^c CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CIRCUIT THEORY; LABORATORIES; OPERATIONAL AMPLIFIERS; OPTICAL DATA PROCESSING; OPTICAL VARIABLES MEASUREMENT; VOLTAGE REGULATORS;

BEST PRACTICES; CURRENT VOLTAGE; DESIGN AND CONSTRUCTION; HIGH-ACCURACY; INTEGRATION PRINCIPLES; NATIONAL PHYSICAL LABORATORY; OPTICAL MEASUREMENT; UNITED KINGDOM;

SILICON DETECTORS;

EID: 60649103171     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.005821     Document Type: Article

References (18)

1. G. H. Rieke, Detection of Light: From the Ultraviolet to the Submillimeter (Cambridge University, 1994).
2. J. Graeme, Photodiode Amplifiers-Op Amp Solutions (McGraw-Hill, 1995),
3. E. Theocharous and E. M. Wareham, "Ultra-high performance photodetection systems for radiometric applications," Meas. Sri. Technol. 15, 1216-1221 (2004).
4. Burr-Brown ACF2101 Data Sheet, http://focus.ti.com/lit/ds/symlink/ acf2101.pdf.
5. P. R. Gray, P. J. Hurst, S. H. Lewis, and R. G. Meyer, "Instability and Nyquist criterion," in Analysis and Design of Analog Integrated Circuits (Wiley, 2001), pp. 626-634.
6. Freescale MC9S08GB60 Data Sheet, http://www.freescale.com/files/ microcontrollers/doc/data-sheet/MC9S08GB60.pdf.
7. H. Ott, "Intrinsic noise sources," in Noise Reduction Techniques in Electronic Systems (Wiley, 1998), pp. 228-243.
8. H. W. Denny, Grounding for the Control of EMI (Don White Consultants, 1983).
9. M. Mardiguian, How to Control Electrical Noise (Don White Consultants, 1981).
10. J. Yeager and M. A. Hrusch-Tupta, eds., Low Level Measurements: Precision DC Current, Voltage, and Resistance Measurements 5th ed. (Keithley Instruments, 1998).
11. E. F. Zalewski and C. R. Duda, "Silicon photodiode device with 100% external quantum efficiency," Appl. Opt. 22, 2867-2873 (1983).
12. G. Eppeldauer and J. E. Hardis, "Fourteen-decade photocurrent measurements with large-area silicon photodiodes at room temperature," Appl. Opt. 30, 3091-3099 (1991).
13. S. D. Biller, N. A. Jelley, M. D. Thorman, N. P. Fox, and T. H. Ward, "Measurements of photomultiplier single photon counting efficiency for the Sudbury Neutrino Observatory," Nucl. Instrum. Methods Phys. Res. A 432, 364-373 (1999).
14. N. P. Fox, "Trap detectors and their properties," Metrologia 28, 197-202 (1991).
15. M. de Podesta and G. Edwards, "The limits of a Rayleighscattering primary thermometer," Int. J. Thermophys. 29, 1719-1729 (2008).
16. J. Geist, G. Brida, and M. L. Rastello, "Prospects for improving the accuracy of silicon photodiode self-calibration with custom cryogenic photodiodes," Metrologia 40, S204-S207 (2003).
17. Y. Ohno and Y. Zong, "Establishment of the NIST flashing light photometric unit," presented at SPIE SD97 Symposium, San Diego, (27 July-1 Aug. 1997).
18. Y. Ohno, C. L. Cromer, J. E. Hardis, and G. Eppeldauer, "The detector-based candela scale and related photometric calibration procedures at NIST," J. Ilium. Eng. Soc. 23, 88-98 (1994).