Investigations on the performance limits of the IMOS transistor

International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT

Volumn , Issue , 2008, Pages 72-75

  Wang, Zhenhua ^a   Huang, Ru ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DRIVE CURRENTS; IMPACT IONIZATION MOS; MOS TRANSISTORS; NON SATURATIONS; OUTPUT CHARACTERISTICS; PERFORMANCE LIMITS;

INTEGRATED CIRCUITS; TRANSISTOR TRANSISTOR LOGIC CIRCUITS; TRANSISTORS;

IMPACT IONIZATION;

EID: 60649084819     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSICT.2008.4734466     Document Type: Conference Paper

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