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Volumn 105, Issue 3, 2009, Pages
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Metal-insulator transition induced by postdeposition annealing in low doped manganite films
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
DOPING (ADDITIVES);
ELECTRIC RESISTANCE;
MAGNETIC PROPERTIES;
METAL ANALYSIS;
METAL INSULATOR BOUNDARIES;
METAL INSULATOR TRANSITION;
OXIDE MINERALS;
OXYGEN;
OXYGENATION;
OXYGENATORS;
SEMICONDUCTOR INSULATOR BOUNDARIES;
DOPED MANGANITES;
EDGE CROSSINGS;
ELECTRICAL RESISTIVITIES;
EXPANSIVE STRAINS;
FERMI ENERGIES;
METAL-INSULATOR TRANSITIONS;
OXYGEN CONTENTS;
OXYGEN PRESSURES;
POST-DEPOSITION ANNEALING;
REMNANT MAGNETIZATIONS;
SR-DOPING;
STRAIN FIELDS;
TRANSPORT AND MAGNETIC PROPERTIES;
OXYGEN VACANCIES;
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EID: 60449090191
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3073894 Document Type: Article |
Times cited : (22)
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References (15)
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