메뉴 건너뛰기




Volumn 19, Issue 9, 2004, Pages 2665-2673

Investigation of vibration fracture behavior of Sn-Ag-Cu solders under resonance

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; DAMPING; FRACTURE; INTERMETALLICS; MICROSTRUCTURE; MORPHOLOGY; SOLDERING ALLOYS; SURFACES; TENSILE STRENGTH;

EID: 6044263752     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2004.0354     Document Type: Article
Times cited : (15)

References (22)
  • 1
    • 51649139688 scopus 로고
    • Lead free solders for electronic packaging
    • S.S. Kang and A.K. Sarkhel: Lead free solders for electronic packaging. J. Electron. Mater. 23, 701 (1994).
    • (1994) J. Electron. Mater. , vol.23 , pp. 701
    • Kang, S.S.1    Sarkhel, A.K.2
  • 3
    • 0036699275 scopus 로고    scopus 로고
    • Tensile properties of Sn-3.5Ag and Sn-3.5Ag-0.75Cu lead-free solders
    • I. Shohji, T. Yoshida, T. Takahashi, and S. Hioki: Tensile properties of Sn-3.5Ag and Sn-3.5Ag-0.75Cu lead-free solders. Mater. Trans. 43, 1854 (2002).
    • (2002) Mater. Trans. , vol.43 , pp. 1854
    • Shohji, I.1    Yoshida, T.2    Takahashi, T.3    Hioki, S.4
  • 5
    • 0942288582 scopus 로고    scopus 로고
    • Inelastic behavior of microelectronics solder joints under concurrent vibration and thermal cycling
    • edited by G.B. Kromann, J.R. Culham, and K. Ramakrishna. (IEEE, Piscataway, NJ)
    • Y. Zhao, C. Basaran, A. Cartwright, and T. Dishongh: Inelastic behavior of microelectronics solder joints under concurrent vibration and thermal cycling. In The 7th Intersociety Conference on Thermal and Thermechanical Phenomena in Electronic Systems, edited by G.B. Kromann, J.R. Culham, and K. Ramakrishna. (IEEE, Piscataway, NJ, 2000), p. 349.
    • (2000) The 7th Intersociety Conference on Thermal and Thermechanical Phenomena in Electronic Systems , pp. 349
    • Zhao, Y.1    Basaran, C.2    Cartwright, A.3    Dishongh, T.4
  • 7
    • 0034205704 scopus 로고    scopus 로고
    • The effect of morphology coarseness on vibration fracture behavior of Pb-Sn solders under various aging conditions
    • C.M. Chuang, T.S. Lui, and L.H. Chen: The effect of morphology coarseness on vibration fracture behavior of Pb-Sn solders under various aging conditions. Mater. Trans. 41, 656 (2000).
    • (2000) Mater. Trans. , vol.41 , pp. 656
    • Chuang, C.M.1    Lui, T.S.2    Chen, L.H.3
  • 8
    • 0013325222 scopus 로고    scopus 로고
    • Effect of lead content on vibration fracture behavior of Pb-Sn eutectic solder
    • C.M. Chuang, T.S. Lui, and L.H. Chen: Effect of lead content on vibration fracture behavior of Pb-Sn eutectic solder. J. Mater. Res. 16, 2644 (2001).
    • (2001) J. Mater. Res. , vol.16 , pp. 2644
    • Chuang, C.M.1    Lui, T.S.2    Chen, L.H.3
  • 9
    • 0035455435 scopus 로고    scopus 로고
    • The characteristics of vibration fracture of Pb-Sn and lead-free Sn-Zn eutectic solders
    • C.M. Chuang, T.S. Lui, and L.H. Chen: The characteristics of vibration fracture of Pb-Sn and lead-free Sn-Zn eutectic solders. J. Electron. Mater. 30, 1232 (2001).
    • (2001) J. Electron. Mater. , vol.30 , pp. 1232
    • Chuang, C.M.1    Lui, T.S.2    Chen, L.H.3
  • 10
    • 0035485234 scopus 로고    scopus 로고
    • Vibration-fracture resistance of Sn-Pb and Sn-Ag eutectic solders
    • C.M. Chuang, T.S. Lui, L.H. Chen, and T.M. Yin: Vibration-fracture resistance of Sn-Pb and Sn-Ag eutectic solders. Mater. Trans. 42, 2064 (2001).
    • (2001) Mater. Trans. , vol.42 , pp. 2064
    • Chuang, C.M.1    Lui, T.S.2    Chen, L.H.3    Yin, T.M.4
  • 12
    • 0030783485 scopus 로고    scopus 로고
    • Crack propagation behavior of A356 aluminum alloy under resonant vibration
    • D.S. Jiang, T.S. Lui, and L.H. Chen: Crack propagation behavior of A356 aluminum alloy under resonant vibration. Scripta Mater. 36, 15 (1997).
    • (1997) Scripta Mater. , vol.36 , pp. 15
    • Jiang, D.S.1    Lui, T.S.2    Chen, L.H.3
  • 13
    • 0942288572 scopus 로고    scopus 로고
    • Effect of aging on the crack propagation behavior of A356 alloy under resonant vibration
    • D.S. Jiang, T.S. Lui, and L.H. Chen: Effect of aging on the crack propagation behavior of A356 alloy under resonant vibration. Mater. Trans. 41, 499 (2000).
    • (2000) Mater. Trans. , vol.41 , pp. 499
    • Jiang, D.S.1    Lui, T.S.2    Chen, L.H.3
  • 14
    • 0032207630 scopus 로고    scopus 로고
    • Mechanical fatigue characteristics of Sn-3.5Ag-X (X = Bi, Cu, Zn and In) solder alloys
    • Y. Kariya and M. Otsuka: Mechanical fatigue characteristics of Sn-3.5Ag-X (X = Bi, Cu, Zn and In) solder alloys. J. Electron. Mater. 27, 1229 (1998).
    • (1998) J. Electron. Mater. , vol.27 , pp. 1229
    • Kariya, Y.1    Otsuka, M.2
  • 15
    • 0037076832 scopus 로고    scopus 로고
    • Six cases of reliability study of Pb-free solder joints in electronic packaging technology
    • K. Zeng and K.N. Tu: Six cases of reliability study of Pb-free solder joints in electronic packaging technology. Mater. Sci. Eng. R38, 55 (2002).
    • (2002) Mater. Sci. Eng. , vol.R38 , pp. 55
    • Zeng, K.1    Tu, K.N.2
  • 16
    • 0033743782 scopus 로고    scopus 로고
    • Tin-silver-copper eutectic temperature and composition
    • M.E. Loomans and M.E. Fine: Tin-silver-copper eutectic temperature and composition. Metall. Mater. Trans. A 31A, 1155 (2000).
    • (2000) Metall. Mater. Trans. A , vol.31 A , pp. 1155
    • Loomans, M.E.1    Fine, M.E.2
  • 18
    • 0036809677 scopus 로고    scopus 로고
    • Study on the microstructure of a novel lead-free solder alloy SnAgCu-RE and its soldered joints
    • Z.G. Chen, Y.W. Shi, Z.D. Xia, and Y.F. Yan: Study on the microstructure of a novel lead-free solder alloy SnAgCu-RE and its soldered joints. J. Electron. Mater. 31, 1122 (2002).
    • (2002) J. Electron. Mater. , vol.31 , pp. 1122
    • Chen, Z.G.1    Shi, Y.W.2    Xia, Z.D.3    Yan, Y.F.4
  • 19
    • 0036680482 scopus 로고    scopus 로고
    • Effects of cooling speed on microstructure and tensile properties of Sn-Ag-Cu alloys
    • K.S. Kim, S.H. Huh, and K. Suganuma: Effects of cooling speed on microstructure and tensile properties of Sn-Ag-Cu alloys. Mater. Sci. Eng. A 333, 106 (2002).
    • (2002) Mater. Sci. Eng. A , vol.333 , pp. 106
    • Kim, K.S.1    Huh, S.H.2    Suganuma, K.3
  • 21
    • 33846541674 scopus 로고
    • Theory of mechanical damping due to dislocation
    • A. Granato and K. Lucke: Theory of mechanical damping due to dislocation. J. App. Phys. 27, 583 (1956).
    • (1956) J. App. Phys. , vol.27 , pp. 583
    • Granato, A.1    Lucke, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.