A review of strain measurement techniques using the grid method

ASTM Special Technical Publication

Volumn 1318, Issue , 1997, Pages 138-155

  Cárdenas García, Jaime F ^a   Wu, Mason M ^b   Hashemi, Javad ^a  

^a Texas Tech University   (United States)

^b BECHTEL CORPORATION   (United States)

Author keywords

Diffraction pattern; Elastic deformation; Full field strain measurement; Grid method; Image processing; Optical diffraction gratings; Optical measuring instruments; Plastic deformation; Strain tensor; Video imaging

Indexed keywords

DIFFRACTION GRATINGS; ELASTICITY; IMAGE PROCESSING; IMAGING TECHNIQUES; PLASTIC DEFORMATION;

DIFFRACTION PATTERN; GRID METHOD; VIDEO IMAGING;

STRAIN MEASUREMENT;

EID: 6044247412     PISSN: 00660558     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1520/stp11897s     Document Type: Review

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