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Volumn 39, Issue 2, 1996, Pages 77-81
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300-mm wafer isolation technology: Lessons from the 200-mm generation
a,b a,c a,d |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 6044228439
PISSN: 0038111X
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (7)
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