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Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 79, Issue 1, 2009, Pages

Impact of diffusion layers in strong electrolytes on the transient current

(5) Marescaux, Matthias a Beunis, Filip a Strubbe, Filip a Verboven, Bart a Neyts, Kristiaan a

a GHENT UNIVERSITY (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; IONIC STRENGTH; OPTICAL DEVICES;

DIFFUSE DOUBLE LAYERS; DIFFUSION LAYERS; HIGH IONIC STRENGTHS; HIGHER ORDERS; ION CONCENTRATIONS; POWER LAWS; STRONG ELECTROLYTES; TRANSIENT CURRENTS; TRANSIENT DIFFUSIONS; VOLTAGE STEPS;

ELECTROLYTES;

EID: 60349122380 PISSN: 15393755 EISSN: 15502376 Source Type: Journal
DOI: 10.1103/PhysRevE.79.011502 Document Type: Article

Times cited : (19)

References (14)

1
- 0001239538
- 10.1016/0927-7757(93)80026-B
- I. D. Morrison, Colloids Surf., A 71, 1 (1993). 10.1016/0927-7757(93) 80026-B
- (1993) Colloids Surf., A , vol.71 , pp. 1
- Morrison, I.D.¹

2
- 33745766611
- 10.1063/1.1708145
- S. K. Deb and J. A. Chopoorian, J. Appl. Phys. 37, 4818 (1966). 10.1063/1.1708145
- (1966) J. Appl. Phys. , vol.37 , pp. 4818
- Deb, S.K.¹ Chopoorian, J.A.²

3
- 33746095381
- B. OâRegan and M. Gr̈tzel, Nature (London) 335, 7377 (1991).
- (1991) Nature (London) , vol.335 , pp. 7377
- Oâregan, B.¹ Gr̈tzel, M.²

4
- 7044226013
- 10.1063/1.1769088
- G. Stojmenovik, S. Vermael, K. Neyts, R. Van Asselt, and A. R. M. Verschueren, J. Appl. Phys. 96, 3601 (2004). 10.1063/1.1769088
- (2004) J. Appl. Phys. , vol.96 , pp. 3601
- Stojmenovik, G.¹ Vermael, S.² Neyts, K.³ Van Asselt, R.⁴ Verschueren, A.R.M.⁵

5
- 0032537718
- 10.1038/28349
- B. Comiskey, J. D. Albert, H. Yoshizawa, and J. Jacobson, Nature (London) 394, 253 (1998). 10.1038/28349
- (1998) Nature (London) , vol.394 , pp. 253
- Comiskey, B.¹ Albert, J.D.² Yoshizawa, H.³ Jacobson, J.⁴

6
- 13244251209
- 10.1021/la047906t
- Y. Won, S. P. Meeker, V. Trappe, and D. A. Weitz, Langmuir 21, 924 (2005). 10.1021/la047906t
- (2005) Langmuir , vol.21 , pp. 924
- Won, Y.¹ Meeker, S.P.² Trappe, V.³ Weitz, D.A.⁴

7
- 33745216249
- 10.1016/j.jcis.2006.03.050
- F. Strubbe, A. R. M. Verschueren, L. J. M. Schlangen, F. Beunis, and K. Neyts, J. Colloid Interface Sci. 300, 396 (2006). 10.1016/j.jcis.2006.03.050
- (2006) J. Colloid Interface Sci. , vol.300 , pp. 396
- Strubbe, F.¹ Verschueren, A.R.M.² Schlangen, L.J.M.³ Beunis, F.⁴ Neyts, K.⁵

8
- 0022768290
- 10.1149/1.2108980
- V. Novotny, J. Electrochem. Soc. 133, 1629 (1986). 10.1149/1.2108980
- (1986) J. Electrochem. Soc. , vol.133 , pp. 1629
- Novotny, V.¹

9
- 35649008852
- 10.1063/1.2805229
- F. Beunis, F. Strubbe, M. Marescaux, and K. Neyts, Appl. Phys. Lett. 91, 182911 (2007). 10.1063/1.2805229
- (2007) Appl. Phys. Lett. , vol.91 , pp. 182911
- Beunis, F.¹ Strubbe, F.² Marescaux, M.³ Neyts, K.⁴

10
- 42749109091
- 10.1103/PhysRevE.70.021506
- M. Z. Bazant, K. Thornton, and A. Ajdari, Phys. Rev. E 70, 021506 (2004). 10.1103/PhysRevE.70.021506
- (2004) Phys. Rev. e , vol.70 , pp. 021506
- Bazant, M.Z.¹ Thornton, K.² Ajdari, A.³

11
- 48349086130
- 10.1103/PhysRevE.78.011502
- F. Beunis, F. Strubbe, M. Marescaux, J. Beeckman, K. Neyts, and A. R. M. Verschueren, Phys. Rev. E 78, 011502 (2008). 10.1103/PhysRevE.78.011502
- (2008) Phys. Rev. e , vol.78 , pp. 011502
- Beunis, F.¹ Strubbe, F.² Marescaux, M.³ Beeckman, J.⁴ Neyts, K.⁵ Verschueren, A.R.M.⁶

12
- 0003497098
- Springer-Verlag, Wien, New York
- S. Selberherr, Analysis and Simulation of Semiconductor Devices (Springer-Verlag, Wien, New York, 1984), pp. 191-197.
- (1984) Analysis and Simulation of Semiconductor Devices , pp. 191-197
- Selberherr, S.¹

13
- 0025409238
- 10.1016/0038-1101(90)90050-O
- P. De Visschere, Solid-State Electron. 33, 455 (1990). 10.1016/0038-1101(90)90050-O
- (1990) Solid-State Electron. , vol.33 , pp. 455
- De Visschere, P.¹

14
- 33846371931
- 10.2478/s11772-006-0054-5
- K. Neyts, J. Beeckman, and F. Beunis, Opto-Electron. Rev. 15, 41 (2007). 10.2478/s11772-006-0054-5
- (2007) Opto-Electron. Rev. , vol.15 , pp. 41
- Neyts, K.¹ Beeckman, J.² Beunis, F.³

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