An approach to the measurement of microwave frequency based on optical power monitoring

IEEE Photonics Technology Letters

Volumn 20, Issue 14, 2008, Pages 1249-1251

  Chi, Hao ^a,b   Zou, Xihua ^b   Yao, Jianping ^b  

^a ZHEJIANG UNIVERSITY   (China)

^b UNIVERSITY OF OTTAWA   (Canada)

Author keywords

Frequency measurement; Microwave photonics; Optical microwave signal processing; Radar signal processing

Indexed keywords

FREQUENCY MEASUREMENTS; MACH ZEHNDER MODULATOR; MATHEMATICAL EXPRESSIONS; MICROWAVE PHOTONICS; MICROWAVE SIGNALS; OPTICAL CARRIERS; OPTICAL MICROWAVE SIGNAL PROCESSING; OPTICAL POWER; POWER LEVELS; PROOF OF CONCEPT; RADAR SIGNAL PROCESSING; SPECTRAL RESPONSE; TWO WAVELENGTH;

ELECTRIC FREQUENCY MEASUREMENT; LIGHT MODULATORS; MICROWAVE FREQUENCIES; MONITORING; RADAR; SIGNAL PROCESSING;

RADAR MEASUREMENT;

EID: 60349092491     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2008.926025     Document Type: Article

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