|
Volumn 107, Issue 6, 2008, Pages 1022-1026
|
Mobility of charge carriers in porous silicon layers
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ADSORPTION;
CARRIER CONCENTRATION;
CARRIER MOBILITY;
CIVIL AVIATION;
ELECTRIC CONDUCTIVITY;
ELECTRIC FIELDS;
NONMETALS;
POROUS SILICON;
BARRIER HEIGHTS;
CONCENTRATION OF;
DONOR AND ACCEPTORS;
DONOR MOLECULES;
ELECTRICAL CONDUCTIVITIES;
FREE CARRIERS;
FREE CHARGE CARRIERS;
IR ABSORPTION SPECTRUM;
JOINT MEASUREMENTS;
LOCAL ELECTRIC FIELDS;
P TYPES;
POROUS SILICON LAYERS;
POTENTIAL BARRIERS;
SILICON NANOCRYSTALS;
CHARGE CARRIERS;
|
EID: 60349090214
PISSN: 10637761
EISSN: None
Source Type: Journal
DOI: 10.1134/S106377610812011X Document Type: Article |
Times cited : (5)
|
References (19)
|