Multiferroic properties of Bi 0.8 La 0.2 FeO 3 /CoFe 2 O 4 multilayer thin films

Applied Surface Science

Volumn 255, Issue 9, 2009, Pages 5092-5095

  Zhang, Shan Tao ^a   Zhang, Yi ^a   Luo, Zhen Lin ^a   Lu, Ming Hui ^a   Gu, Zheng Bin ^a   Chen, Yan Feng ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

Bi 0.8 La 0.2 FeO 3; CoFe 2 O 4; Multiferroics; Multilayer thin films

Indexed keywords

FILM PREPARATION; HYSTERESIS; HYSTERESIS LOOPS; MAGNETIZATION; MULTILAYER FILMS; PLATINUM COMPOUNDS; POLARIZATION; PULSED LASER DEPOSITION; SILICON COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

BI0.8LA0.2FEO3; COFE2O4; FERROELECTRIC HYSTERESIS LOOP; MAGNETIZATION HYSTERESIS-LOOP; MULTI-LAYER THIN FILM; MULTI-LAYERED STRUCTURE; MULTIFERROIC PROPERTIES; MULTIFERROICS;

MULTILAYERS;

EID: 60249103816     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.12.009     Document Type: Article

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