Johann crystal diffraction spectrometer for measuring small chemical shifts of soft X-ray lines

Technical Physics Letters

Volumn 35, Issue 1, 2009, Pages 73-75

  Petrunin, A A ^a   Sovestnov, A E ^a   Tyunis, A V ^a   Fomin, E V ^a  

^a PETERSBURG NUCLEAR PHYSICS INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 60249093472     PISSN: 10637850     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063785009010222     Document Type: Article

References (5)

1. O. I. Sumbaev A. F. Mezentsev 1965 Zh. Éksp. Teor. Fiz. 48 445 [Sov. Phys. JETP 21, 295 (1965)]
2. O. I. Sumbaev 1978 Usp. Fiz. Nauk 124 281 [Sov. Phys. Usp. 21, 141 (1978)
3. A. V. Tyunis, Candidate's Dissertation in Physics and Mathematics (St. Petersburg, 1996).
4. H. H. Johann 1031 Z. Phys. 69 185
5. V. A. Shaburov, Candidate's Dissertation in Physics and Mathematics (Leningrad, 1975).