Application of AFM in a study of the selective oxidation behavior of materials during the early oxidation stage

Scripta Materialia

Volumn 60, Issue 8, 2009, Pages 699-702

  Peng, X ^a   Li, L ^a   Wang, F ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

Author keywords

Atomic force microscopy; Electroplating; Nanocomposite; Oxidation; Roughening

Indexed keywords

ATOMIC PHYSICS; ATOMS; CHROMIUM; CHROMIUM ALLOYS; ELECTROCHEMISTRY; NANOCOMPOSITES; NICKEL; OXIDATION; SCALE (DEPOSITS);

AFM; ATOMIC-FORCE MICROSCOPIES; CHROMIA; COARSE-GRAINED; CR NANOPARTICLES; ELECTROPLATING; MATRIXES; NANO-CRYSTALLINE; NANOCOMPOSITE; NI-20CR; OXIDATION STAGES; OXIDE SCALE; ROUGHENING; SELECTIVE OXIDATIONS; TWO-MATERIALS;

ATOMIC FORCE MICROSCOPY;

EID: 60249092129     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2008.12.056     Document Type: Article

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