The utilization of thin film transistor liquid crystal display waste glass as a pozzolanic material

Journal of Hazardous Materials

Volumn 163, Issue 2-3, 2009, Pages 916-921

  Lin, K L ^a   Huang, Wu Jang ^b   Shie, J L ^a   Lee, T C ^c   Wang, K S ^d   Lee, C H ^e  

^a National Ilan University 1   (Taiwan)

^b NATIONAL PINGTUNG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^c NATIONAL UNITED UNIVERSITY   (Taiwan)

^d NATIONAL CENTRAL UNIVERSITY   (Taiwan)

^e DA YEH UNIVERSITY   (Taiwan)

Author keywords

Degree of hydration; Gel space ratio; Strength activity index; Thin film transistor liquid crystal display; Waste glass

Indexed keywords

DEGREE OF HYDRATION; GEL/SPACE RATIO; STRENGTH ACTIVITY INDEX; THIN FILM TRANSISTOR LIQUID CRYSTAL DISPLAY; WASTE GLASS;

ALUMINOSILICATES; CALCIUM; CEMENT MANUFACTURE; CEMENTS; CLAY MINERALS; ENVIRONMENTAL PROTECTION AGENCY; HYDRATES; HYDRATION; LEACHING; LIGHT SOURCES; LIQUID CRYSTAL DISPLAYS; LIQUID CRYSTALS; PORTLAND CEMENT; SILICATES; SOLIDS; SPURIOUS SIGNAL NOISE; THIN FILM DEVICES; THIN FILM TRANSISTORS; THIN FILMS; TRANSISTORS; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

GLASS;

CLAY; CONCENTRATION (COMPOSITION); DECOMPOSITION; GEL; HYDRATION; LEACHING; MIXING; X-RAY DIFFRACTION;

ALUMINUM SILICATES; CALCIUM COMPOUNDS; CONSERVATION OF NATURAL RESOURCES; CONSTRUCTION MATERIALS; GLASS; INDUSTRIAL WASTE; LIQUID CRYSTALS; SILICATES;

EID: 60049092512     PISSN: 03043894     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jhazmat.2008.07.044     Document Type: Article

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