Analytical modeling of IGZO thin-film transistors based on the exponential distribution of deep and tail states

Journal of the Korean Physical Society

Volumn 54, Issue 1 PART 2, 2009, Pages 527-530

  Shin, Jae Heon ^a   Hwang, Chi Sun ^a   Cheong, Woo Seok ^a   Park, Sang Hee Ko ^a   Cho, Doo Hee ^a   Ryu, Minki ^a   Yoon, Sung Min ^a   Byun, Chun Won ^a   Yang, Shin Hyuk ^a   Chu, Hye Yong ^a   Cho, Kyoung Ik ^a  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

Analytical modeling; Deep state; IGZO; Oxide TFT; Tail state; Threshold voltage

Indexed keywords

EID: 60049084146     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.54.527     Document Type: Conference Paper

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