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Volumn 22, Issue 2, 2008, Pages 382-386

A new hydrodynamic instability in ultra-thin film flows induced by electro-osmosis

Author keywords

Electro osmosis; Instability; Interface; Microfluidics; Nano

Indexed keywords

CUT-OFF; DEBYE LENGTH; ELECTRIC FIELD STRENGTH; ELECTROOSMOTIC FLOW; HYDRODYNAMIC INSTABILITIES; INSTABILITY; INTERFACE; INTERFACE DEFORMATION; MOVING BOUNDARIES; NANO; NANOFLUIDIC FLOWS; NEUTRAL STABILITY; PARAMETRIC SPACES; POTENTIAL DISTRIBUTIONS; SOLID SUBSTRATES; STABILITY ANALYSIS; THIN LIQUID LAYER; WAVE NUMBERS;

EID: 60049083554     PISSN: 1738494X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12206-007-1025-6     Document Type: Article
Times cited : (17)

References (6)
  • 4
    • 24344494421 scopus 로고    scopus 로고
    • A finite element formulation of frequency-dependent electro-osmosis
    • DOI 10.1016/j.jcis.2005.04.042, PII S0021979705004194
    • T. Khan P. M. Reppert 2005 A finite element formulation of frequency dependent electro-osmosis J. Colloid Interface Sci. 290 574 581 (Pubitemid 41262137)
    • (2005) Journal of Colloid and Interface Science , vol.290 , Issue.2 , pp. 574-581
    • Khan, T.1    Reppert, P.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.