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Volumn 38, Issue 1, 2009, Pages 58-67

X-ray microanalysis of glass for forensic purposes - Research on the persistence of glass fragments on clothing

Author keywords

[No Author keywords available]

Indexed keywords

FORENSIC ENGINEERING; FORENSIC SCIENCE; SCANNING ELECTRON MICROSCOPY;

EID: 59949090289     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1116     Document Type: Article
Times cited : (10)

References (18)
  • 12
    • 85153546138 scopus 로고    scopus 로고
    • RD Koons, J Buscaglia. J. Forensic Sci. 2002, 47, 505.
    • RD Koons, J Buscaglia. J. Forensic Sci. 2002, 47, 505.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.