Tailoring high-frequency properties of permalloy films by submierometer patterning

IEEE Transactions on Magnetics

Volumn 45, Issue 1, 2009, Pages 71-74

  Wang, Pingshan ^a   Zhang, Hanqiao ^a   Divan, Ralu ^b   Hoffmann, Axel ^b  

^a AMRL   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Magnetic anisotropy; Magnetic resonance; Patterned thin film; Permalloy; Susceptibility

Indexed keywords

IRON ALLOYS; MAGNETIC ANISOTROPY; MAGNETIC RESONANCE; MAGNETIC SUSCEPTIBILITY; NICKEL ALLOYS; PERMALLOY; THIN FILMS;

FERROMAGNETIC RESONANCE FREQUENCY; HIGH-FREQUENCY PROPERTIES; MICROMAGNETIC SIMULATIONS; PATTERNED THIN FILMS; PERMALLOY (PY); PERMALLOY FILMS; SINGLE DOMAINS; SUBMICROMETERS;

FERROMAGNETIC RESONANCE;

EID: 59849122896     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2008.2005330     Document Type: Article

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