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Volumn 20, Issue 4, 2009, Pages 301-304
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Micro-porous silicon structure with low optical reflection
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON FILMS;
COMPLEX MORPHOLOGIES;
ETCHING PROCESS;
FINE GRAINS;
NOVEL METHODS;
OPTICAL CHARACTERISTICS;
OPTICAL REFLECTIONS;
POROUS SILICON STRUCTURES;
SELECTIVE ETCHINGS;
ETCHING;
GRAIN BOUNDARIES;
LIGHT REFLECTION;
NONMETALS;
OPTICAL SENSORS;
POROUS SILICON;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON WAFERS;
AMORPHOUS SILICON;
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EID: 59749106053
PISSN: 09574522
EISSN: 1573482X
Source Type: Journal
DOI: 10.1007/s10854-008-9724-z Document Type: Article |
Times cited : (6)
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References (15)
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