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Volumn 36, Issue 5 PART 1, 2008, Pages 2088-2094

An electron trap for studying cross-field mobility in Hall thrusters

Author keywords

Electric fields; Electric potential; Electron traps; Hall effect devices; Magnetic confinement; Magnetic fields; Plasma confinement; Plasma devices; Plasma measurements; Plasmas; Probes

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRIC FIELD MEASUREMENT; ELECTRIC FIELDS; ELECTRIC POTENTIAL; ELECTRON MOBILITY; ELECTRON TRAPS; ELECTRONS; ELECTROSTATICS; GALVANOMAGNETIC EFFECTS; HALL EFFECT; HALL EFFECT DEVICES; HALL MOBILITY; MAGNETIC FIELDS; MAGNETIC MATERIALS; MAGNETISM; PLASMA CONFINEMENT; PLASMA DEVICES; PLASMA DIAGNOSTICS; PLASMAS; PROBES; PROGRAMMING THEORY;

EID: 59749102906     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPS.2008.2004231     Document Type: Article
Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.