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Applied Physics A: Materials Science and Processing

Volumn 94, Issue 4, 2009, Pages 735-738

SEM and HRTEM analysis of ZnS nanoflakes produced by a simple route

(5) Gayou, V L a Salazar Hernandez, B a Zavala, G b Santiago, P c Ascencio, J A d

a UNIVERSIDAD AUTÓNOMA DEL ESTADO DE MORELOS (Mexico)

b INSTITUTO DE BIOTECNOLOGÍA (Mexico)

c UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO (Mexico)

d INSTITUTO DE CIENCIAS FÍSICAS (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; ELECTRON MICROSCOPY; HIGH RESOLUTION ELECTRON MICROSCOPY; NANOCRYSTALLINE ALLOYS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; PASSIVATION; SCANNING ELECTRON MICROSCOPY; ZINC SULFIDE;

ANISOTROPIC INTERACTIONS; BRIGHT FIELDS; CRYSTALLINE PARTICLES; DARK FIELDS; ECO-FRIENDLY; HIGH RESOLUTIONS; HRTEM ANALYSIS; NANO-MATERIALS; NANO-SIZED; NANOFLAKES; NANOMETER SIZES; PHOSPHATE IONS; ROOM TEMPERATURES; SCANNING ELECTRONS; SELF-ASSEMBLED; SEM; TRANSMISSION ELECTRONS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 59749102141 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-008-5063-4 Document Type: Article

Times cited : (5)

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