Integrating Al with NiO nano honeycomb to realize an energetic material on silicon substrate

Applied Physics A: Materials Science and Processing

Volumn 94, Issue 4, 2009, Pages 957-962

  Zhang, Kaili ^a   Rossi, Carole ^a   Alphonse, Pierre ^b   Tenailleau, Christophe ^b   Cayez, Simon ^b   Chane Ching, Jean Yves ^b  

^a UNIVERSITÉ DE TOULOUSE   (France)

^b UNIVERSITÉ PAUL SABATIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRODEPOSITION; EVAPORATION; HONEYCOMB STRUCTURES; IMPURITIES; INTEGRATION; MATERIALS; MATERIALS PROPERTIES; MECHANICAL PROPERTIES; MICROSYSTEMS; OXIDATION; SCANNING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SUBSTRATES; SYNTHESIS (CHEMICAL); THERMOANALYSIS; VAPORS; X RAY DIFFRACTION ANALYSIS;

ENERGETIC MATERIALS; ENERGY RELEASE; FULLY COMPATIBLE; FUNCTIONAL DEVICES; IGNITION TEMPERATURES; INTERFACIAL CONTACTS; NI THIN FILMS; SCANNING CALORIMETRIES; SCANNING ELECTRONS; SILICON SUBSTRATES; THERMAL ANALYSIS; THERMAL OXIDATIONS; TWO-DIMENSIONAL; X- RAY DIFFRACTIONS;

THERMAL EVAPORATION;

EID: 59749090553     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-008-4875-6     Document Type: Article

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