X-ray fluorescence holography of In1 - x Gax Sb mixed crystal

Journal of Crystal Growth

Volumn 311, Issue 3, 2009, Pages 978-981

  Hosokawa, S ^a   Ozaki, T ^a   Takata, N ^a   Happo, N ^b   Ikemoto, H ^c   Shishido, T ^d   Hayashi, K ^d  

^a HIROSHIMA INSTITUTE OF TECHNOLOGY   (Japan)

^b HIROSHIMA CITY UNIVERSITY   (Japan)

^c UNIVERSITY OF TOYAMA   (Japan)

^d TOHOKU UNIVERSITY   (Japan)

Author keywords

A1. X ray diffraction; B1. Antimonides; B1. Gallium compounds; B2. Semiconducting III V materials

Indexed keywords

ATOMIC PHYSICS; BOND LENGTH; DIFFRACTION; FLUORESCENCE; GALLIUM COMPOUNDS; HOLOGRAPHIC INTERFEROMETRY; HOLOGRAPHY; KRAFT PULP; LATTICE CONSTANTS; SINGLE CRYSTALS; TERNARY SYSTEMS; THREE DIMENSIONAL; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

A1. X-RAY DIFFRACTION; ATOMIC POSITIONS; B1. ANTIMONIDES; B1. GALLIUM COMPOUNDS; B2. SEMICONDUCTING III-V MATERIALS; CONCENTRATION RANGES; INTER-ATOMIC DISTANCES; LATTICE DISTORTIONS; MIXED CRYSTALS; MIXED SINGLE CRYSTALS; VEGARD'S LAWS; X-RAY ABSORPTION FINE STRUCTURES; X-RAY FLUORESCENCE HOLOGRAPHIES;

ATOMS;

EID: 59749084937     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2008.09.120     Document Type: Article

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