Simulation of ion trajectories using the surface-charge method on a special purpose computer

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 600, Issue 2, 2009, Pages 466-470

  Aoki, J ^a,b   Kubo, A ^a   Ishihara, M ^a   Toyoda, M ^a,b  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Ion trajectory simulation; Mass spectrometry; Multi turn time of flight mass spectrometer

Indexed keywords

COMPUTERS; ELECTRIC FIELD EFFECTS; ELECTRIC FIELDS; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; IONS; MASS SPECTROMETRY; NEGATIVE IONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPECTROMETERS; SPECTROMETRY; SPECTRUM ANALYSIS; THREE DIMENSIONAL; TRAJECTORIES;

ANALYTICAL MODELS; CYLINDRICAL CAPACITORS; ELECTRODE GEOMETRIES; ION TRAJECTORY SIMULATION; MULTI-TURN TIME-OF-FLIGHT MASS SPECTROMETER; SPECIAL-PURPOSE COMPUTERS;

MASS SPECTROMETERS;

EID: 59649116308     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2008.11.095     Document Type: Article

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