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Volumn 470, Issue 1-2, 2009, Pages 568-573
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Surface of Ti-Ni alloys after their preparation
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Author keywords
AFM; Alloy preparation; Phase composition; Surface topography; TEM; XPS
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Indexed keywords
ALLOYS;
ATOMIC FORCE MICROSCOPY;
DIFFRACTION;
ELECTRON MICROSCOPY;
ENGINEERING GEOLOGY;
HOLOGRAPHIC INTERFEROMETRY;
IRON ALLOYS;
METALLIC COMPOUNDS;
NICKEL;
PHASE COMPOSITION;
PHOTOELECTRON SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SPECTRUM ANALYSIS;
SURFACE TOPOGRAPHY;
TITANIUM ALLOYS;
TRANSMISSION ELECTRON MICROSCOPY;
AFM;
ALLOY PREPARATION;
ALLOY SURFACES;
ATOMIC-FORCE MICROSCOPIES;
CHEMICAL COMPOSITIONS;
ELECTRO-CHEMICAL POLISHING;
ENERGY DISPERSIVE;
HIGH-CONTRAST IMAGES;
PHASE CHARACTERIZATIONS;
PURE METALS;
SCANNING ELECTRONS;
SEM;
SURFACE CHARACTERISTICS;
TEM;
TI-NI ALLOYS;
TRANSMISSION ELECTRONS;
X- RAY DIFFRACTIONS;
X-RAY PHOTOELECTRON SPECTROSCOPIES;
X-RAY SPECTROSCOPIES;
XPS;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 59449105827
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2008.03.050 Document Type: Article |
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Times cited : (16)
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References (13)
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