Design of a high-resolution step-and-scan type monochromator capable of tuning to undulator radiation over a wavelength range of 80-180nm

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2856, Issue , 1996, Pages 300-306

  Koike, Masato ^a   Heimann, Philip A ^a   Namioka, Takeshi ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b OFFICE OF NAVAL RESEARCH   (Japan)

Author keywords

Aberrations; Diffraction grating; Synchrotron beamline; Vuv monochromator

Indexed keywords

ABERRATIONS; LIGHT SOURCES; LUMINANCE; MONOCHROMATORS; SCANNING; SYNCHROTRON RADIATION; SYNCHROTRONS; WAVEFRONTS; WIGGLERS;

ADVANCED LIGHT SOURCE; ENERGY RESOLUTIONS; LAWRENCE BERKELEY NATIONAL LABORATORY; RADIUS OF CURVATURE; SCANNING MECHANISMS; SYNCHROTRON BEAMLINES; UNDULATOR RADIATION; WAVELENGTH RANGES;

DIFFRACTION GRATINGS;

EID: 5944252129     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.259861     Document Type: Conference Paper

References (9)

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