Optical frequency stability measurement of an external cavity blue diode laser with an optical frequency comb

Japanese Journal of Applied Physics

Volumn 47, Issue 12, 2008, Pages 8856-8858

  Kohno, Takuya ^a,b   Yasuda, Masami ^a,b   Inaba, Hajime ^a,b   Hong, Feng Lei ^a,b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Blue diode laser; External cavity diode laser; Hollow cathode lamp; Laser cooling; Optical frequency comb; Saturated absorption; Ytterbium

Indexed keywords

ABSORPTION; COOLING; DIODES; ELECTRON SOURCES; FREQUENCY STABILITY; LASER COOLING; NATURAL FREQUENCIES; OPTICAL MATERIALS; SYSTEM STABILITY; YTTERBIUM;

BLUE DIODE LASER; EXTERNAL CAVITY DIODE LASER; HOLLOW-CATHODE LAMP; OPTICAL FREQUENCY COMB; SATURATED ABSORPTION;

LASERS;

EID: 59349092102     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.8856     Document Type: Article

References (25)

1. S. Nakamura and W. Kaenders: Laser Focus World 35 (1999) No. 4, 69.
2. R. S. Conroy, J. J. Hewett, G. P. T. Lancaster, W. Sibbett, J. W. Allen, and K. Dholakia: Opt. Commun. 175 (2000) 1.85.
3. S. Uetake, K. Hayasaka, and M. Watanabe: Jpn. J. Appl. Phys. 42 (2003) L332.
4. K. Matsubara, S. Uetake, H. Ito, Y. Li, K. Hayasaka, and M. Hosokawa: Jpn. J. Appl. Phys. 44 (2005) 229.
5. K. Hayasaka, S. Urabe, and M. Watanabe: Jpn. J. Appl. Phys. 39 (2000) L687.
6. K. Toyoda, A. Miura, S. Urabe, K. Hayasaka, and M. Watanabe: Opt.Lett. 26 (2001) 1897.
7. K. Hayasaka: Opt. Commun. 206 (2002) 401.
8. K. Komori, Y. Takasu, M. Kumakura, Y. Takahashi, and T. Yabuzaki: Jpn. J. Appl. Phys. 42 (2003) 5059.
9. J. I. Kim, C. Y. Park, J. Y. Yeom, E. B. Kim, and T. H. Yoon: Opt. Lett. 28 (2003) 245.
10. C. Y. Park and T. H. Yoon: Jpn. J. Appl. Phys. 42 (2003) L754.
11. C. Y. Park and T. H. Yoon: Phys. Rev. A 68 (2003) 055401.
12. C. W. Hoyt, Z. W. Barber, C. W. Oates, T. M. Fortier, S. A. Diddams, and L. Hollberg: Phys. Rev. Lett. 95 (2005) 083003.
13. P. Gill, and H. Margolis: Phys. World 18 (2005) No. 5, 35.
14. Th. Udem, J. Reichert, R. Holzwarth, and T. W. Hansen: Phys. Rev. Lett. 82 (1999) 3568.
15. D. J. Jones, S. A. Diddams, J. K. Ranka, A. Stentz, R. S. Windeler, J. L. Hall, and S. T. Cundiff: Science 288 (2000) 635.
16. H. Katori: in Proc. 6th Symp. Frequency Standards and Metrology, ed. P. Gill (World Scientific, Singapore, 2002) p. 323.
17. M. Takamoto, F.-L. Hong, R. Higashi, and H. Katori: Nature 435 (2005) 321.
18. A. S. Arnold, J. S. Wilson, and M. G. Boshier: Rev. Sci. Instrum. 69 (1998) 1236.
19. C. J. Hawthorn, K. P. Weber, andR. E. Scholten: Rev. Sci. Instrum. 72 (2001) 4477.
20. T. Yabuzaki, T. Kawamura, and T. Ogawa: Proc. 10th Int. Conf. Atomic Physics, Tokyo, 1986, p. 184.
21. T. Ikegami, S. Ohshima, and M. Ohtsu: Jpn. J. Appl. Phys. 28 (1989) L1839.
22. T. Loftus, J. R. Bochinski, and T. W. Mossberg: Phys. Rev. A 63 (2001) 023402.
23. F.-L. Hong, A. Onae, J. Jiang, R. Guo, H. Inaba, K. Minoshima, T. R. Schibli, H. Matsumoto, and K. Nakagawa: Opt. Lett. 28 (2003) 2324.
24. C. S. Edwards, G. P. Barwood, P. Gill, and W. R. C. Rowley: Electron. Lett. 31 (1995) 796.
25. M. Yasuda, F.-L. Hong, T. Kohno, H. Inaba, K. Hosaka, C. Willis, T. Kurosu, A. Onae, and S. Ohshima: Proc. SPIE 6673 (2007) 66730D.