Spatial scatter effects in the calibration of ir pyrometers and imagers

International Journal of Thermophysics

Volumn 30, Issue 1, 2009, Pages 167-178

  Envall, J ^a   Mekhontsev, S N ^a   Zong, Y ^a   Hanssen, L M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Imager; Infrared (IR); Pyrometer; Radiometer; Size of source effect (SSE); Spatial scatter

Indexed keywords

IMAGER; INFRARED (IR); PYROMETER; RADIOMETER; SIZE-OF-SOURCE EFFECT (SSE); SPATIAL SCATTER;

CALIBRATION; ELECTROMAGNETIC WAVE EMISSION; IMAGE SENSORS; INFRARED SPECTROMETERS; MEASUREMENT ERRORS; METEOROLOGICAL INSTRUMENTS; PYROMETERS; PYROMETRY; RADIOMETERS; TEMPERATURE MEASURING INSTRUMENTS;

RADIOMETRY;

EID: 59349091239     PISSN: 0195928X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10765-008-0547-1     Document Type: Article

References (16)

1. M. Ohtsuka R.E. Bedford 1989 Measurement 7 2
2. P. Bloembergen, in Proceedings of TEMPMEKO '99, 7th International Symposium on Temperature and Thermal Measurements in Industry and Science, ed. by J.F. Dubbeldam, M.J. de Groot (Edauw Johannissen bv, Delft, 1999), pp. 607-612
3. P. Marcarino T. Ricolfi 1996 Metrologia 33 291
4. H.W. Yoon D.W. Allen R.D. Saunders 2005 Metrologia 42 89
5. P. Saunders H. Edgar 1999 High Temp. High Press. 31 283
6. H. Tonooka 2005 IEEE Trans. Geosci. Remote Sens. 43 2752
7. T.J. Quinn, T.R.D. Chandler, in Temperature, Its Measurement and Control in Science and Industry, vol. 4, part 1, ed. by H. Plumb (ISA, Pittsburgh, 1972), pp. 295-309
8. P.B. Coates J.W. Andrews 1978 J. Phys. F: Met. Phys. 8 277
9. B.C. Johnson, J.B. Fowler, C.L. Cromer, in The SeaWiFS Transfer Radiometer (SXR), NASA Tech. Memo 1998-206892, vol. 1, ed. by S.B. Hooker, E.R. Firestone (NASA Goddard Space Flight Center, Greenbelt, MD, 1998), p. 58
10. T.P. Jones J. Tapping 1982 Metrologia 18 23
11. S. Mekhontsev, L. Hanssen, in Temperature: Its Measurement and Control in Science and Industry, vol. 7, part 1, ed. by D.C. Ripple (AIP, New York, 2003), pp. 693-698
12. Certain commercial equipment, instruments, or materials are identified in this paper for information only. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology
13. M. Noorma, S. Mekhontsev, V. Kromchenko, A. Gura, M. Litorja, B. Tsai, L. Hanssen, Proc. SPIE 6205, 620501 (2006)
14. S. Mekhontsev, V. Khromchenko, A. Prokhorov, L. Hanssen, in Proceedings of TEMPMEKO 2004, 9th International Symposium on Temperature and Thermal Measurements in Industry and Science, ed. by D. Zvizdic (FSB/LPM, Zagreb, Croatia, 2004), pp. 581-586
15. D. Hong K.J. Voss 2004 Appl. Optics 43 665
16. Y. Zong, S.W. Brown, K.R. Lykke, Y. Ohno, in Proceedings of the 26th Session of the CIE, Beijing (2007)