-
3
-
-
18444363352
-
-
THSFAP 0040-6090 10.1016/j.tsf.2004.11.042.
-
R. Klenk, J. Klaer, R. Scheer, M. Ch. Lux-Steiner, I. Luck, N. Meyer, and U. Rühle, Thin Solid Films THSFAP 0040-6090 10.1016/j.tsf.2004.11.042 480, 509 (2005).
-
(2005)
Thin Solid Films
, vol.480
, pp. 509
-
-
Klenk, R.1
Klaer, J.2
Scheer, R.3
Lux-Steiner, M.Ch.4
Luck, I.5
Meyer, N.6
Rühle, U.7
-
5
-
-
0001097065
-
-
0031-9015
-
S. Taguchi, T. Gota, M. Takeda, and G. Kido, J. Phys. Soc. Jpn. 57, 3256 (1988). 0031-9015
-
(1988)
J. Phys. Soc. Jpn.
, vol.57
, pp. 3256
-
-
Taguchi, S.1
Gota, T.2
Takeda, M.3
Kido, G.4
-
6
-
-
0035359110
-
-
0021-4922
-
T. Matsumoto-Aoki, T. Shimojo, H. Kumakura, H. Uchiki, and S. Iida, Jpn. J. Appl. Phys., Part 1 40, 4077 (2001). 0021-4922
-
(2001)
Jpn. J. Appl. Phys., Part 1
, vol.40
, pp. 4077
-
-
Matsumoto-Aoki, T.1
Shimojo, T.2
Kumakura, H.3
Uchiki, H.4
Iida, S.5
-
7
-
-
0041792572
-
-
Suppl. 39-1,. 0021-4922
-
S. Shirakata, T. Terasako, and S. Isomura, Jpn. J. Appl. Phys. 39, Suppl. 39-1, 116 (2000). 0021-4922
-
(2000)
Jpn. J. Appl. Phys.
, vol.39
, pp. 116
-
-
Shirakata, S.1
Terasako, T.2
Isomura, S.3
-
8
-
-
0042737718
-
-
0022-3697
-
M. V. Yakushev, Y. Feofanov, R. W. Martin, R. D. Tomlinson, and A. V. Mudryi, J. Phys. Chem. Solids 64, 2011 (2003). 0022-3697
-
(2003)
J. Phys. Chem. Solids
, vol.64
, pp. 2011
-
-
Yakushev, M.V.1
Feofanov, Y.2
Martin, R.W.3
Tomlinson, R.D.4
Mudryi, A.V.5
-
9
-
-
0001541527
-
-
PLRBAQ 0556-2805 10.1103/PhysRevB.4.2463.
-
B. Tell, J. L. Shay, and H. M. Kasper, Phys. Rev. B PLRBAQ 0556-2805 10.1103/PhysRevB.4.2463 4, 2463 (1971).
-
(1971)
Phys. Rev. B
, vol.4
, pp. 2463
-
-
Tell, B.1
Shay, J.L.2
Kasper, H.M.3
-
10
-
-
0020143176
-
-
JLUMA8 0022-2313 10.1016/0022-2313(82)90029-1.
-
J. J. M. Binsma, L. J. Giling, and J. Bloem, J. Lumin. JLUMA8 0022-2313 10.1016/0022-2313(82)90029-1 27, 55 (1982).
-
(1982)
J. Lumin.
, vol.27
, pp. 55
-
-
Binsma, J.J.M.1
Giling, L.J.2
Bloem, J.3
-
11
-
-
41049100052
-
-
APPLAB 0003-6951 10.1063/1.2896301.
-
M. V. Yakushev, R. W. Martin, A. V. Mudryi, and A. V. Ivaniukovich, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2896301 92, 111908 (2008).
-
(2008)
Appl. Phys. Lett.
, vol.92
, pp. 111908
-
-
Yakushev, M.V.1
Martin, R.W.2
Mudryi, A.V.3
Ivaniukovich, A.V.4
-
12
-
-
33645527173
-
-
APPLAB 0003-6951 10.1063/1.2152114.
-
M. V. Yakushev, A. V. Mudryi, I. V. Victorov, J. Krustok, and E. Mellikov, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2152114 88, 011922 (2006).
-
(2006)
Appl. Phys. Lett.
, vol.88
, pp. 011922
-
-
Yakushev, M.V.1
Mudryi, A.V.2
Victorov, I.V.3
Krustok, J.4
Mellikov, E.5
-
13
-
-
18444385904
-
-
THSFAP 0040-6090 10.1016/j.tsf.2004.11.075.
-
K. Wakita, K. Nishi, Y. Ohta, and T. Onishi, Thin Solid Films THSFAP 0040-6090 10.1016/j.tsf.2004.11.075 480, 283 (2005).
-
(2005)
Thin Solid Films
, vol.480
, pp. 283
-
-
Wakita, K.1
Nishi, K.2
Ohta, Y.3
Onishi, T.4
-
14
-
-
0000642227
-
-
APPLAB 0003-6951 10.1063/1.1345802.
-
K. Yoshino, T. Ikari, S. Shirakata, H. Miyake, and K. Hiramatsu, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1345802 78, 742 (2001).
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 742
-
-
Yoshino, K.1
Ikari, T.2
Shirakata, S.3
Miyake, H.4
Hiramatsu, K.5
-
15
-
-
0001584892
-
-
JPCSAW 0022-3697 10.1016/0022-3697(76)90157-8.
-
D. C. Look and T. C. Manthuruthil, J. Phys. Chem. Solids JPCSAW 0022-3697 10.1016/0022-3697(76)90157-8 37, 173 (1976).
-
(1976)
J. Phys. Chem. Solids
, vol.37
, pp. 173
-
-
Look, D.C.1
Manthuruthil, T.C.2
-
16
-
-
0000884399
-
-
PRBMDO 0163-1829 10.1103/PhysRevB.61.8363.
-
Y. Yamada, T. Sakashita, H. Watanabe, H. Kugimiya, S. Nakamura, and T. Taguchi, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.61.8363 61, 8363 (2000).
-
(2000)
Phys. Rev. B
, vol.61
, pp. 8363
-
-
Yamada, Y.1
Sakashita, T.2
Watanabe, H.3
Kugimiya, H.4
Nakamura, S.5
Taguchi, T.6
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