Extended X-ray absorption fine structure study of p-type nitrogen doped ZnO

Chemical Physics Letters

Volumn 469, Issue 4-6, 2009, Pages 318-320

  Mu, Wei ^a,b   Kerr, Lei L ^a,b   Leyarovska, Nadia ^a,b  

^a MIAMI UNIVERSITY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ABSORPTION SPECTRA; ATOMIC PHYSICS; ATOMS; ELECTROMAGNETIC WAVE ABSORPTION; ENERGY ABSORPTION; NITROGEN; SEMICONDUCTING ZINC COMPOUNDS; THERMAL EVAPORATION; X RAY ABSORPTION; ZINC OXIDE;

BONDING LENGTHS; CATALYST-FREE THERMAL EVAPORATIONS; EXAFS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; GLASS SUBSTRATES; LOW COSTS; NITROGEN ATOMS; NITROGEN-DOPED; P TYPES; P-TYPE ZNO; X-RAY ABSORPTION FINE STRUCTURES; ZNO; ZNO FILMS;

ZINC;

EID: 59249090706     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2009.01.011     Document Type: Article

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