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Volumn 517, Issue 8, 2009, Pages 2651-2655
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Thin films of porphyrin molecules imaged with the atomic force microscope
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Author keywords
Atomic force microscopy; Dewetting; Graphite; Mica; Molecular monolayer; Porphyrin; Self assembly
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ATOMIC PHYSICS;
ATOMS;
ELECTRON ENERGY LEVELS;
GRAPHITE;
GROWTH (MATERIALS);
MICA;
MOLECULES;
NUCLEATION;
PORPHYRINS;
SELF ASSEMBLY;
SILICATE MINERALS;
SURFACE DEFECTS;
TWO DIMENSIONAL;
ZINC;
ATOMIC FORCE MICROSCOPES;
DEWETTING;
MOLECULAR MONOLAYER;
NUCLEATION AND GROWTHS;
PORPHYRIN;
PORPHYRIN MOLECULES;
SINGLE LAYERS;
SPINODAL DEWETTING;
ZINC PORPHYRINS;
ZINC COMPOUNDS;
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EID: 59149097500
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2008.10.051 Document Type: Article |
Times cited : (5)
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References (26)
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