Workshop on measurement needs for local-structure determination in inorganic materials

Journal of Research of the National Institute of Standards and Technology

Volumn 113, Issue 6, 2008, Pages 321-333

  Levin, Igor ^a   Vanderah, Terrell ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Diffraction; Local structure; Measurements; Microscopy; Nanostructure; Spectroscopy

Indexed keywords

ATOMS; CHARACTERIZATION; DIELECTRIC MATERIALS; DIFFRACTION; DISTRIBUTED COMPUTER SYSTEMS; GLOBAL OPTIMIZATION; MAGNETIC LEVITATION VEHICLES; MEASUREMENTS; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; OPEN SOURCE SOFTWARE; OPEN SYSTEMS; PROBLEM SOLVING; SPECTROSCOPY;

COMPREHENSIVE MEASUREMENT; EDUCATION AND TRAINING; EXPERIMENTAL TECHNIQUES; LOCAL STRUCTURE; MATERIALS CHARACTERIZATION; MATERIALS DEVELOPMENT; MEASUREMENT TECHNIQUES; OPTIMIZATION FRAMEWORK;

NANOSTRUCTURES;

EID: 59049090718     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.113.026     Document Type: Article

References (1)

1. S. Billinge and I. Levin, The Problem with Determining Atomic Positions on the Nanoscale, Science 315, 561-565 (2007).