Epitaxial and polycrystalline CuInS2 layers: Structural metastability and its influence on the photoluminescence

Thin Solid Films

Volumn 517, Issue 7, 2009, Pages 2248-2251

  Eberhardt, J ^a   Cieslak, J ^a   Metzner, H ^a   Hahn, Th ^a   Goldhahn, R ^b   Hudert, F ^b   Krausslich J ^a   Kaiser, U ^a   Chuvilin, A ^a   Reislohner U ^a   Witthuhn, W ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

CuInS2; MBE; Photoluminescence; SAED; XRD

Indexed keywords

COPPER COMPOUNDS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; DEFECTS; DIFFRACTION; ENERGY GAP; EPITAXIAL LAYERS; GROUND STATE; LIGHT; LIGHT EMISSION; LUMINESCENCE; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; MOLECULAR DYNAMICS; MOLYBDENUM; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; SEMICONDUCTOR QUANTUM WIRES; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

BAND GAPS; CUINS2; DEEP LEVELS; ELECTRONIC LEVELS; EXCITONIC LUMINESCENCES; EXCITONIC TRANSITIONS; HIGH DENSITIES; INTRINSIC DEFECTS; LUMINESCENCE PEAKS; MBE; PHOTOLUMINESCENCE MEASUREMENTS; PL SPECTRUM; POLY-CRYSTALLINE; POLYCRYSTALLINE FILMS; POLYCRYSTALLINE LAYERS; SAED; SELECTED-AREA ELECTRON DIFFRACTION MEASUREMENTS; SHALLOW DEFECTS; SI (1 1 1); SI SUBSTRATES; SINGLE-CRYSTALLINE; SOLAR-CELL MATERIALS; STRUCTURAL METASTABILITY; X- RAY DIFFRACTIONS; XRD;

EPITAXIAL FILMS;

EID: 58949103820     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.10.096     Document Type: Article

References (17)

1. Yakushev M.V., Mudryi A.V., Victorov I.V., Krustoc J., and Mellikov E. Appl. Phys. Lett. 88 (2006) 011922
2. Metzner H., Cieslak J., Eberhardt J., Hahn Th., Müller M., Kaiser U., Chuvilin A., Reislöhner U., Witthuhn W., Goldhahn R., Hudert F., and Kräußlich J. Appl. Phys. Lett. 83 (2003) 1563
3. Hahn Th., Metzner H., Cieslak J., Eberhardt J., Reislöhner U., Kräußlich J., Wunderlich F., Siebentritt S., and Witthuhn W. J. Phys. Chem. Solids 66 (2005) 1899
4. Siemer K., Klaer J., Luck I., Bruns J., Klenk R., and Bräunig D. Sol. Energy Mater. Sol. Cells 57 (2001) 159
5. Metzner H., Reislöhner U., Cieslak J., Hahn Th., Kräußlich J., and Witthuhn W. Thin Solid Films 403-404 (2002) 13
6. Hahn Th., Metzner H., Plikat B., and Seibt M. Appl. Phys. Lett. 72 (1998) 2733
7. Matz W., Schell N., Bernhard G., Prokert F., Reich T., Claußner J., Oehme W., Schlenk R., Dienel S., Funke H., Eichhorn F., Betzl M., Pröhl D., Strauch U., Hüttig G., Krug H., Neumann W., Brendler V., Reichel P., Denecke M.A., and Nitsche H. J. Synchrotron Radiat. 6 (1999) 1076
8. Su D.S., and Wei S.-H. Appl. Phys. Lett. 74 (1999) 2483
9. Su D.S., Neumann W., Hunger R., Schubert-Bischoff P., Giersig M., Scheer R., and Zeitler E. Appl. Phys. Lett. 73 (1998) 785
10. Hahn T., Metzner H., Plikat B., and Seibt M. Thin Solid Films 387 (2001) 83
11. Hahn Th., Cieslak J., Metzner H., Eberhardt J., Reislöhner U., Gossla M., Witthuhn W., and Kräußlich J. Appl. Phys. Lett. 88 (2006) 171915
12. Eberhardt J., Metzner H., Goldhahn R., Hudert F., Reislöhner U., Hülsen C., Cieslak J., Hahn Th., Gossla M., Dietz A., Gobsch G., and Witthuhn W. Thin Solid Films 480-481 (2005) 415
13. Eberhardt J., Schulz K., Metzner H., Cieslak J., Hahn Th., Reislöhner U., Gossla M., Hudert F., Goldhahn R., and Witthuhn W. Thin Solid Films 515 (2007) 6147
14. Rudigier E., Enzenhofer T., and Scheer R. Thin Solid Films 480-481 (2005) 327
15. Cieslak J., Hahn Th., Metzner H., Eberhardt J., Witthuhn W., Kräußlich J., and Wunderlich F. Phys. Rev., B 75 (2007) 245306
16. Eberhardt J., Metzner H., Schulz K., Reislöhner U., Hahn Th., Cieslak J., Witthuhn W., Goldhahn R., Hudert F., and Kräußlich J. J. Appl. Phys. 102 (2007) 033503
17. Rudigier E., Barcones B., Luck I., Jawhari-Colin T., Pérez-Rodriguez A., and Scheer R. J. Appl. Phys. 95 (2004) 5153