SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 517, Issue 7, 2009, Pages 2469-2472

Intrinsic defects and metastability effects in Cu2O

(3) Mittiga, A a Biccari, F a Malerba, C a

a ENEA C R CASACCIA (Italy)

Author keywords

Capacitance Transient; Cuprous oxide; Defect complex; Persistent Photoconductivity

Indexed keywords

CAPACITANCE; COPPER; COPPER OXIDES; DEFECTS; PHOTOCONDUCTIVITY; PHOTOELECTRICITY; VANADIUM COMPOUNDS;

CAPACITANCE TRANSIENT; CAPACITANCE- VOLTAGES; CUPROUS OXIDE; DEFECT COMPLEX; DEFECT PROPERTIES; ELECTRONIC MECHANISMS; EXPERIMENTAL DATUM; INTRINSIC DEFECTS; METASTABILITY EFFECTS; NEW MODELS; PERSISTENT PHOTO CONDUCTIVITIES; PERSISTENT PHOTOCONDUCTIVITY; QUANTITATIVE EVALUATIONS; REVERSE BIAS; SCHOTTKY;

ELECTRIC CONDUCTIVITY;

EID: 58949089548 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2008.11.054 Document Type: Article

Times cited : (37)

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