Test beam characterization of 3-D silicon pixel detectors

IEEE Transactions on Nuclear Science

Volumn 55, Issue 6, 2008, Pages 3731-3735

  Mathes, Markus ^a   Cristinziani, M ^a   Da Via, C ^c   Garcia Sciveres, M ^h   Einsweiler, K ^h   Hasi, J ^c   Kenney, C ^g   Parker, S I ^d   Reuen, L ^a   Ruspa, M ^e,f   Velthuis, J ^a,b   Watts, S ^c   Wermes, Norbert ^a  

^a UNIVERSITY OF BONN   (Germany)

^b UNIVERSITY OF BRISTOL   (United Kingdom)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

^d UNIVERSITY OF HAWAII   (United States)

^e UNIVERSITY OF EASTERN PIEDMONT   (Italy)

^f SEZIONE DI TORINO   (Italy)

^g Molecular Biology Consortium   (United States)

^h LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Pixel detectors; Silicon radiation detectors; Vertex detectors

Indexed keywords

COLLIDING BEAM ACCELERATORS; DETECTORS; ELECTRODES; INVERSE KINEMATICS; METAL DETECTORS; NONMETALS; PIXELS; RADIATION DAMAGE; RADIATION DETECTORS; READOUT SYSTEMS; SENSORS; THREE DIMENSIONAL;

3-D ELECTRODES; BINARY READOUTS; BULK MATERIALS; CELL DIMENSIONS; CHARGE COLLECTIONS; CHARGE SHARING; CYLINDRICAL ELECTRODES; ELECTRODE CONFIGURATIONS; FRONT-END CHIPS; HYBRID PIXEL DETECTORS; LARGE HADRON COLLIDER LHC; LOW BIAS VOLTAGES; PIXEL DETECTORS; PLANAR ELECTRODES; RADIATION ENVIRONMENTS; READ-OUT ELECTRONICS; SI DETECTORS; SILICON PIXEL DETECTORS; SILICON RADIATION DETECTORS; SPATIAL RESOLUTIONS; TEST BEAMS; UNIRRADIATED DEVICES; VERTEX DETECTORS;

SILICON DETECTORS;

EID: 58849092737     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2005630     Document Type: Conference Paper

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