|
Volumn 3167, Issue , 1997, Pages 81-92
|
Statistical estimators of spatial vector fields in defect classification and texture modeling of high-tech surfaces
a a |
Author keywords
Circular spherical statistics; Scattering; Surface microtopography; Vector fields
|
Indexed keywords
CUSTOMER SATISFACTION;
DIGITAL IMAGE STORAGE;
FLAT PANEL DISPLAYS;
GAUSSIAN DISTRIBUTION;
IMAGE PROCESSING;
IMAGING SYSTEMS;
QUALITY ASSURANCE;
QUALITY FUNCTION DEPLOYMENT;
RANDOM PROCESSES;
STATISTICAL TESTS;
TEXTURES;
TOTAL QUALITY MANAGEMENT;
TRELLIS CODES;
VECTORS;
CIRCULAR/SPHERICAL STATISTICS;
CONFIDENCE INTERVAL (CI);
DEFECT CLASSIFICATION;
DEFECT DETECTION;
FAST ACQUISITION;
FLAT PANELS;
GAUSSIAN;
LINE QUALITY;
SCATTERING;
SIMULATION RESULTS;
STATISTICAL ESTIMATORS;
SURFACE MICROTOPOGRAPHY;
TECHNICAL SURFACES;
TEXTURE MODELING;
VECTOR FIELDS;
STATISTICS;
|
EID: 58749104723
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.290279 Document Type: Conference Paper |
Times cited : (2)
|
References (8)
|