Mapping of loci affecting copper tolerance in wheat-The possible impact of the vernalization gene Vrn-A1

Environmental and Experimental Botany

Volumn 65, Issue 2-3, 2009, Pages 369-375

  Bálint, András Ferenc ^a,b   Szira, Fruzsina ^b   Röder, Marion S ^a   Galiba, Gábor ^b   Börner, Andreas ^a  

^a LEIBNIZ INSTITUTE OF PLANT GENETICS AND CROP PLANT RESEARCH IPK   (Germany)

^b INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

Author keywords

Cbf genes; Copper tolerance; Deletion lines; Introgression lines; QTL mapping; Single chromosome recombinant lines; Vrn gene; Wheat

Indexed keywords

CHROMOSOME; COPPER; DETECTION METHOD; EXPERIMENTAL STUDY; GENE EXPRESSION; INTROGRESSION; MAPPING; MAPPING METHOD; PLEIOTROPY; POLLUTION TOLERANCE; RECOMBINATION; VERNALIZATION; WHEAT;

AEGILOPS TAUSCHII; TRITICUM AESTIVUM;

EID: 58649100239     PISSN: 00988472     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.envexpbot.2008.11.004     Document Type: Article

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