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Volumn 3014, Issue , 1997, Pages 53-61
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Anomalous interface degradation of a-Si:H TFTs during LCD lifetime
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Author keywords
A Si:H TFTs; AMLCDs; Gate insulator; Interface degradation; Modeling; Reliability; Stability
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Indexed keywords
DRAIN CURRENT;
ELECTRIC FIELDS;
GATE DIELECTRICS;
GATES (TRANSISTOR);
LIGHT SOURCES;
LIQUID CRYSTAL DISPLAYS;
LIQUID CRYSTALS;
SILICON;
THIN FILM TRANSISTORS;
THRESHOLD VOLTAGE;
A-SI:H TFTS;
AMLCDS;
GATE INSULATOR;
INTERFACE DEGRADATION;
MODELING;
RELIABILITY;
STABILITY;
DEGRADATION;
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EID: 58649093323
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.270300 Document Type: Conference Paper |
Times cited : (1)
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References (6)
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