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Volumn 3014, Issue , 1997, Pages 53-61

Anomalous interface degradation of a-Si:H TFTs during LCD lifetime

Author keywords

A Si:H TFTs; AMLCDs; Gate insulator; Interface degradation; Modeling; Reliability; Stability

Indexed keywords

DRAIN CURRENT; ELECTRIC FIELDS; GATE DIELECTRICS; GATES (TRANSISTOR); LIGHT SOURCES; LIQUID CRYSTAL DISPLAYS; LIQUID CRYSTALS; SILICON; THIN FILM TRANSISTORS; THRESHOLD VOLTAGE;

EID: 58649093323     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.270300     Document Type: Conference Paper
Times cited : (1)

References (6)
  • 2
    • 58649095233 scopus 로고    scopus 로고
    • F.R. Libsch, IEEE IEDM, San Francisco, CA, 681 (1992).
    • F.R. Libsch, IEEE IEDM, San Francisco, CA, 681 (1992).
  • 3
    • 58649103913 scopus 로고    scopus 로고
    • F.R. Libsch and J. Kanicki, SID, Seattle, WA, 455 (1993).
    • F.R. Libsch and J. Kanicki, SID, Seattle, WA, 455 (1993).
  • 4
    • 58649118794 scopus 로고    scopus 로고
    • T. Tsujimura and F.R. Libsch, IDRC, Birmingham, England (1996).
    • T. Tsujimura and F.R. Libsch, IDRC, Birmingham, England (1996).
  • 5
    • 58649085622 scopus 로고    scopus 로고
    • F.R. Libsch and J. Kanicki, SSDM, Tsukuba, Japan, 155 (1992).
    • F.R. Libsch and J. Kanicki, SSDM, Tsukuba, Japan, 155 (1992).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.