|
Volumn 20, Issue 3, 2009, Pages 248-252
|
Microstructure and dielectric properties of CBS glass-doped Sr 0.5Ba 0.5Nb 2O 6 ceramic system
|
Author keywords
[No Author keywords available]
|
Indexed keywords
C. X-RAY DIFFRACTION;
CERAMIC ROUTES;
CERAMIC SYSTEMS;
DIELECTRIC CONSTANTS;
GLASS CONTENT;
GLASS DOPING;
GRAIN SIZES;
MASS FRACTIONS;
PHASE FORMATIONS;
ROOM-TEMPERATURE (RT);
SECONDARY PHASE;
SINGLE PHASING;
TUNGSTEN BRONZES;
BARIUM;
BRONZE;
CERAMIC CAPACITORS;
CERAMIC MATERIALS;
CONTEXT SENSITIVE GRAMMARS;
DIELECTRIC PROPERTIES;
DIELECTRIC WAVEGUIDES;
DOPING (ADDITIVES);
ELECTRIC CIRCUIT BREAKERS;
GLASS;
MICROSTRUCTURE;
NIOBIUM;
PERMITTIVITY;
SILICON COMPOUNDS;
SINTERING;
TUNGSTEN;
X RAY DIFFRACTION ANALYSIS;
GLASS CERAMICS;
|
EID: 58549104555
PISSN: 09574522
EISSN: 1573482X
Source Type: Journal
DOI: 10.1007/s10854-008-9711-4 Document Type: Article |
Times cited : (9)
|
References (17)
|