Instantaneous availability and interval availability for systems with time-varying failure rate: Stair-step approximation

Proceedings of IEEE Pacific Rim International Symposium on Dependable Computing, PRDC

Volumn 2001-January, Issue , 2001, Pages 371-374

  Sun, Hairong ^a   Han, James J ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVAILABILITY; STAIRS;

ELECTRONIC PRODUCT; FAILURE RATE; INSTANTANEOUS AVAILABILITIES; NUMERICAL RESULTS; OPERATIONAL LIFETIME; STAIR-STEP; STEADY-STATE AVAILABILITY; TIME-VARYING FAILURE RATES;

FAILURE ANALYSIS;

EID: 58549086299     PISSN: 15410110     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PRDC.2001.992722     Document Type: Conference Paper

References (2)

1. K. S. Trivedi, Probability and Statistics with Reliability, Queuing and Computer Science Applications, Prentice-Hall
2. T. F. Hassett, et al, Time-varying Failure Rates in the Availability & Reliability Analysis of Repairable Systems, IEEE Trans. Reliability, vol. 44, no. 1, 1995, pl55-160.