Maxima-SPRT methodology for health monitoring of contact resistance in IC sockets

2008 International Conference on Prognostics and Health Management, PHM 2008

Volumn , Issue , 2008, Pages

  Lopez, Leoncio D ^a   Pecht, Michael G ^b  

^a SUN MICROSYSTEMS   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

Accelerated test; Contact resistance; Elastomer socket; Health monitoring; Physics of failure

Indexed keywords

CONTACT RESISTANCE; DEGRADATION; DURABILITY; HEALTH; INTEGRATED CIRCUITS; PLASTICS; POLYMERS; PROBABILITY; RUBBER; STRUCTURES (BUILT OBJECTS);

ACCELERATED TEST; DAISY CHAINING; ELASTOMER SOCKET; HEALTH MONITORING; IC SOCKETS; INDUSTRY STANDARDS; NEW APPROACHES; PHYSICS OF FAILURE; PROBABILITY RATIOS; STRESS CONDITIONS; THRESHOLD VALUE(T);

TESTING;

EID: 58449134865     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PHM.2008.4711465     Document Type: Conference Paper

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