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Volumn 17, Issue 2, 2009, Pages 723-730

An iterative model of diffuse illumination from bidirectional photometric data

Author keywords

[No Author keywords available]

Indexed keywords

DISTRIBUTION FUNCTIONS; LUMINANCE; PHOTOMETRY;

EID: 58449133929     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.000723     Document Type: Article
Times cited : (8)

References (23)
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    • Diffuse and specular reflectance from rough surface
    • B. van Ginneken, M. Staveridi and J. J. Koendrik, "Diffuse and specular reflectance from rough surface," Appl. Opt. 37, 130-139 (1998).
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    • van Ginneken, B.1    Staveridi, M.2    Koendrik, J.J.3
  • 10
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    • A statistical model of wave scattering from random rough surfaces
    • K. Tang and R. O. Buckius, "A statistical model of wave scattering from random rough surfaces," Int. J. Heat Mass Transfer 44, 4095-4073 (2001).
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    • Tang, K.1    Buckius, R.O.2
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    • Monte Carlo calculation for electromagnetic-wave scattering from random rough Surfaces
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    • Garcia, N.1    Stoll, E.2
  • 14
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    • K. Tang, R. Dimenna, and R. Buckius, Regions of validity of the geometric optics approximation for angular scattering from very rough surface, Int. Heat J. Mass Transfer 40,49-59 (1997).
    • K. Tang, R. Dimenna, and R. Buckius, "Regions of validity of the geometric optics approximation for angular scattering from very rough surface," Int. Heat J. Mass Transfer 40,49-59 (1997).
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    • 84894388691 scopus 로고    scopus 로고
    • J. de Boer, Modelling indoor illumination by complex fenestration systems based on bidirectional : Basics, Measurement, and Rating, J. Society for Information Display 14/11,1003-1017 (2006).
    • J. de Boer, "Modelling indoor illumination by complex fenestration systems based on bidirectional : Basics, Measurement, and Rating," J. Society for Information Display 14/11,1003-1017 (2006).
  • 18
    • 0032095974 scopus 로고    scopus 로고
    • Evaluation and characterization of display reflectance
    • M. E. Becker, "Evaluation and characterization of display reflectance," Displays 19, 35-54 (1998).
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  • 21
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    • Transfer function characterization of scattering surface
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    • M. W. Hodapp, Applications for High-Brightness Light-Emitting Diodes, in Semiconductors and Semimetals 48, G. B. Stringfellow and M. G. Craford ed., (Academic Press, San Diego, 1997) Semiconductors and Semimetals 48, Chap. 6, p. 227.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.