Self-assembled polyelectrolyte thin films: film morphology and ionic strength

Synthetic Metals

Volumn 102, Issue 1-3, 1999, Pages 1021-

  Ho, Peter K H ^a   Friend, Richard H ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONFORMATIONS; IONIC STRENGTH; LIGHT EMITTING DIODES; MOLECULAR STRUCTURE; MORPHOLOGY; PLASTIC FILMS; POLYELECTROLYTES; SURFACE ROUGHNESS;

POLYMER CHAIN CONFORMATION; POLYSTYRENE SULPHONATE; POLYXYLYLENE TETRAHYDROTHIOPHENIUM;

THIN FILMS;

EID: 58449116082     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(98)01275-2     Document Type: Article

References (5)

1. G. Decher, J. D. Hong, J. Schmitt, Thin Solid Films 210-211, 831 (1992).
2. H. Hong et al., J. Appl. Phys. 79, 1 (1996).
3. A. C. Fou et al., J. Appl. Phys. 79, 7501 (1995).
4. J. Hodak et al., Langmuir 13, 2708 (1997).
5. P. K. H. Ho et al., Adv. Mater., 10, 769 (1998).