Measuring temporal speckle correlations at ultrafast x-ray sources

Optics Express

Volumn 17, Issue 1, 2009, Pages 55-61

  Gutt, C ^a   Stadler, L M ^a   Duri, A ^a   Autenrieth, T ^a   Leupolid, O ^a   Chushkin, Y ^b   Griibel, G ^a  

^a DESY   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOCORRELATION; COHERENT SCATTERING; ELECTRONS; FREE ELECTRON LASERS;

COHERENT DIFFRACTION; CONVENTIONAL TECHNIQUES; CORRELATION SPECTROSCOPY; INTENSITY AUTOCORRELATION; INTERMEDIATE SCATTERING FUNCTIONS; PHOTON STATISTICS; ULTRAFAST TIMESCALES; X-RAY FREE ELECTRON LASERS;

SPECKLE;

ARTICLE; AUTOMATED PATTERN RECOGNITION; KINETICS; LASER; METHODOLOGY; NORMAL DISTRIBUTION; OPTICS; RADIATION SCATTERING; SURFACE PROPERTY; SYNCHROTRON; X RAY; X RAY DIFFRACTION;

KINETICS; LASERS; NORMAL DISTRIBUTION; OPTICS AND PHOTONICS; PATTERN RECOGNITION, AUTOMATED; SCATTERING, RADIATION; SURFACE PROPERTIES; SYNCHROTRONS; X-RAY DIFFRACTION; X-RAYS;

EID: 58449114450     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.000055     Document Type: Article

References (8)

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